Disk Media Inspection

Inspection of data storage media requires non-contact metrology systems with high accuracy and high throughput. Critical dimensions such as interior diameter, exterior diameter, roundness, concentricity, flatness, chamfer length, and chamfer angle must be rapidly measured against exacting tolerances. Systems need to combine accurate and repeatable measurement capabilities with high-performance auto-focus and flexible programmability.

VIEW’s proven family of Summit systems offers the flexibility and performance required for near-line metrology of data storage media. VIEW’s Pinnacle or Summit XP systems provide the appropriate capabilities for higher volume sampling.