VIEW Engineering began in Chatsworth, CA in 1976. VIEW’s reputation for innovation and quality dates from 1977 when it introduced the world’s first 3-axis, automated, vision measurement system, the RB-1.

RB-1

In 1978, VIEW introduced the PR-1, the first inline pattern recognition system, and dramatically reduced the time needed to package semiconductor chips.

PR-1

The firsts continued with the 719, the inline binary machine vision-based system introduced in 1981. This is the system that brought 2D machine vision to the shop floor in a wide variety of industries.

719

The 1200 was the first high-accuracy machine vision-based CMM. Introduced in 1982, it included innovations such as granite stages and the first version of VIEW’s Programmable Ring Light (PRL).

1200

The 720 and the 1220 were the grayscale versions of VIEW’s inline and CMM offerings. They were introduced in 1985.

1220

The 725, the first inline, multi-camera, QFP and PLCC package inspection system, was introduced in 1986. Almost all Intel CPUs were inspected by this system in its day.

725

The Précis 3000 was VIEW’s first large travel CMM, introduced in 1987.

Précis 3000

1988 saw the introduction of the Bazic series of CMMs.

Bazic

A higher-accuracy CMM called the Ultra8 was introduced in 1989. This CMM featured very high-resolution scales and a compound stage made of a granite composite.

Ultra8

VIEW upgraded the 725 with a greatly improved part-handling system and introduced it as the 7100 in 1990. Hundreds of 7100 (and 7200) systems were used by Intel facilities around the world to inspect QFPs and PLCCs.

7150

The PC-based Voyager systems, predecessors of VIEW’s current video and laser-based CMM products, were introduced in 1993.

Voyager

1994 saw the introduction of the 830, a high-speed PGA inspection system that was used to inspect every Pentium and virtually all other PGA CPUs produced at that time.

830

The 880, the highest-speed and most accurate in-tray inspection system, was introduced in 1995, as was the 8100, an inline 3D scanning-laser system.

880

A bump-on-die inspection system, called the 890, was introduced in 1997. It was one of the first such systems able to inspect 100% of bumped wafers.

890

In 1999, VIEW introduced the first version of the Pinnacle video and laser-based CMM. This was the most accurate CMM ever produced by VIEW. It introduced the dual-magnification optics concept and, a few years later, the TTL laser.

Pinnacle

The Pinnacle was followed up in 2001 with the introduction of the Summit series of high-accuracy, large-travel CMMs.

Summit

Over the next five years, VIEW’s engineers refined the technologies and products further until they became the versions of the Pinnacle, Summit, and Benchmark products that are sold by VIEW today.

VIEW’s Present

As a member of the Quality Vision International (QVI) family of companies, VIEW is backed by a worldwide organization with a 60-year heritage of metrology system design, manufacturing, and service support. Headquartered in Rochester, NY, QVI operates technical and manufacturing facilities in five US cities and in Frankfurt, Singapore, Pune, and Shanghai.